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Scanning Electron Microscope (SEM)
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Most detailed analysis
When more details of a preparation have to be analyzed, the use of an Scanning Electron Microscope (SEM) is necessary. In addition to giving us the possibility of “looking” at very high magnification, it also allows for chemical analysis of minute details. Our electron microscope is equipped with the following detectors and can apply the techniques below:- Secondary Electron (SE) detector for surface visualization (topography)
- “Back-scattered” electron detector for material contrast and orientation contrast representation
- Quantitative and qualitative X-ray micro-analysis (EDS, WDS) for determination of element distribution over a certain surface, for mapping of coatings, or for particulate measurements
- Spectral imaging: a full spectrum per pixel; acquisition of 1,000 to 10,000 pixels per second. The complete dataset can be called up to perform a new analysis.
Based on spectral images, our own KEMphase program can give not only a clear overview of the elements present, but even of the compounds.
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